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Microscope Thermography for Micro-objects of 10-20 μm: ThermalViewX MCR Series

ViewOhre Imaging Co., Ltd.
Microscope Thermography for Micro-objects of 10-20 μm: ThermalViewX MCR Series
Microscopic thermography

Microscopic thermography

Temperature measurement solution for what cannot be measured with a thermocouple

Currently, as the trend towards miniaturization and fine structural patterns advances across all products and components, the issue of heat generation has become more prevalent.

Localized heat concentration is difficult to capture through simulation, and small objects cannot be measured with thermocouples due to the challenges of attaching them to such small dimensions. Conventional thermography fails to measure small objects, necessitating dedicated thermography equipment.

The ThermalViewX MCR Series is ideal for micro-area measurement. It excels in temperature measurement and captures thermal images with micron-level resolution.

Measuring heat generation issues due to miniaturization

Measuring heat generation issues due to miniaturization

The ideal tool for temperature measurement of small devices and components

Preventing abnormal overheating is essential for extending product lifespan and avoiding malfunctions, but temperature measurement presents technical challenges. Accurate quantification of heat generation is particularly important, and recent emphasis has been placed on its validity and supporting evidence. Conventional thermocouples struggle to measure the temperature of small objects accurately, and conventional thermography finds it difficult to measure minute objects.

The microscope thermography of the ThermalViewX MCR Series utilizes proprietary calibration and correction technology to achieve temperature measurement in micro-areas. Additionally, being non-contact and non-destructive, it offers the advantage of easy implementation and use.
Achieving high resolution

Achieving high resolution

Extensive experience in micron-level temperature measurement

The ThermalViewX MCR Series features detectors with sufficient sensitivity to capture microscopic areas and optical systems with adequate resolution. It automatically utilizes complex calibrations and occasional corrections to address errors specific to microscopic regions.

Customers can choose the system they need from a wide range of options, including multiple resolutions, operating distances, measurement ranges, video analysis, and differential analysis. The small model measures as fine as 8.7 μm, while the cooled model achieves 3 μm precision, with temperature measurement capabilities up to 400°C for the small type and 2000°C for the large type.

With over 10 years on the market, the ThermalViewX MCR Series has been extensively utilized in corporate research labs and factories, national and public research institutions, universities, and scientific research, demonstrating its reliability and effectiveness.
A wide range of models and diverse analyses

A wide range of models and diverse analyses

A tool that contributes to society and businesses

The ThermalViewX MCR Series provides long-term support with compatibility ranging from Windows 7 to 11. Emphasizing the importance of data as an asset, it ensures that data from the first unit can be analyzed with the latest version.

This series plays a crucial role in fields such as advanced semiconductors, carbon neutrality, and green energy, amid the race for ultra-miniaturized and highly efficient devices. It is extensively used for temperature evaluation, heat source identification, and thermal conductivity assessment of wafer patterns, material structures, micro heat sources, light-emitting devices, micro encapsulants, and small components and materials.

By enabling excellent research, production improvement, defect analysis, and failure prevention, it creates new value and significantly contributes to society and businesses.

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